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US Patent Issued to INTEGRAL GEOMETRY SCIENCE on Sept. 15 for "Inspecting device and inspecting method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,573, issued on Sept. 15, was assigned to INTEGRAL GEOMETRY SCIENCE INC. (Hyogo, Japan). "Inspecting device and inspecting method" was inve... Read More


US Patent Issued to Apple on Sept. 15 for "Electronic devices with electromagnetic interference correction" (California Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,574, issued on Sept. 15, was assigned to Apple Inc. (Cupertino, Calif.). "Electronic devices with electromagnetic interference correction"... Read More


US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on Sept. 15 for "Internal short circuit prediction generation" (Michigan Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,575, issued on Sept. 15, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Internal short circuit prediction generation" was... Read More


US Patent Issued to HUAYUAN SEMICONDUCTOR (SHENZHEN), Huayuan Semiconductor (Tianjin) on Sept. 15 for "Disconnection point detection method for single-wire series circuits, single-wire series circuit, and driver architecture" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,576, issued on Sept. 15, was assigned to HUAYUAN SEMICONDUCTOR (SHENZHEN) Ltd. COMPANY (Shenzhen, China) and Huayuan Semiconductor (Tianjin... Read More


US Patent Issued to Boston Semi Equipment on Sept. 15 for "Contactor for voltage isolation and breakdown testing" (Wisconsin, Massachusetts, Minnesota Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,577, issued on Sept. 15, was assigned to Boston Semi Equipment LLC (Billerica, Mass.). "Contactor for voltage isolation and breakdown test... Read More


US Patent Issued to ABB SCHWEIZ on Sept. 15 for "Diagnosis and prognosis of IGBT modules" (Polish, Swiss, Finnish Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,578, issued on Sept. 15, was assigned to ABB SCHWEIZ AG (Baden, Switzerland). "Diagnosis and prognosis of IGBT modules" was invented by Al... Read More


US Patent Issued to Imec vzw, Katholieke Universiteit Leuven, KU LEUVEN R&D on Sept. 15 for "Tamper-aware age sensor" (Belgian Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,579, issued on Sept. 15, was assigned to Imec vzw (Leuven, Belgium) and Katholieke Universiteit Leuven, KU LEUVEN R&D (Leuven, Belgium). "... Read More


US Patent Issued to International Business Machines on Sept. 15 for "Parallel dipole line photo-hall system with temperature gradient stage" (New York, New Jersey Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,580, issued on Sept. 15, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Parallel dipole line photo-hall system wit... Read More


US Patent Issued to ATECO on Sept. 15 for "Insert inserted to tray for transporting semiconductor products, tray including the insert, and semiconductor product test system including the insert" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,581, issued on Sept. 15, was assigned to ATECO INC. (Gunpo-si, South Korea). "Insert inserted to tray for transporting semiconductor produ... Read More


US Patent Issued to ADVANTEST on Sept. 15 for "Device handling apparatus and device testing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,582, issued on Sept. 15, was assigned to ADVANTEST Corp. (Tokyo). "Device handling apparatus and device testing apparatus" was invented by... Read More